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Description

EC-V2-SS ADAPTERSmall Sample Adapter for Second Generation Dimension EC Cell DESCRIPTION Small Sample Adapter for Second Generation Dimension EC Cell Enables use of small samples with second generation EC cell Made of Teflon for maximum solvent compatibility Included with the second generation Dimension Icon and Edge EC accessories (Models ICONEC V2 NOPOT, ICONEC V2 POT 100V, 110V, EDGEEC V2 NOPOT, EDGEEC V2 POT 100V, 110V) but available as a spare part REQUIRES one

In electrical applications

Combines a tip with 1 nm nominal end radius

PLEASE NOTE: Sample cross-sectioning by cleaving or polishing is required

High resolution electrical imaging with a sharp conductive tip

it is typically not necessary to have a reflective coating

FastScan-D-SS probes have less than 3 degrees of bend

Super sharp tip for highest resolution combined with intermediate spring constant for applications including:

35 Cantilever Geometry: Triangular Cantilevers Number: 1 Back Side Coating: Reflective Gold

For non-electrical applications where wear resistance is required

As with all Adama probes

This cross-sectional sample holder is designed to hold a wafer cross-section upright for edge inspection and it can be used on all microscopes

A pack of 10 High quality etched silicon probes for hard TappingMode™ and other non-contact modes