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VGRP-GSCalibration Artifact: 180nm Depth, 10m Pitch, Pt Coated, on a glass slide DESCRIPTION CANTILEVER SPECIFICATIONS Calibration Artifact: 180nm Depth, 10m Pitch, Pt coated, mounted on a glass slide. These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes. It is a reference artifact, where the specifications are met through tight manufacturing tolerances and not by individual

12 N/m spring constant to provide highest resolution imaging when preservation of tip and sample are most challenging

These probes marry the sharpness of a Silicon tip with the low spring constant and high sensitivity of a Silicon Nitride cantilever

and a magnetic moment of 0

NOTE: The PeakForce QNM license key will expire approximately sixmonths following installation of the evaluation kit

Modified sample holder for nanoIR3

making them ideal for use on all Bruker and non-Bruker AFMs

110 kHz nominal resonant frequency in fluid

The new O-ring

Replaces models DTFML-DD and DTFMLSP

New imaging mode allows quantitative mapping of nano-mechanicalproperties including elastic modulus

These 60mm

200N/m nominal