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Description

Small Springloaded Vise ClampDESCRIPTION Interchangeable Modular SEM Specimen Holders This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS LEO dovetail stage adapter one of the adapter buttons 15372 or 15372 10 is needed. 15341 4 Small Springloaded Vise Clamp, M4 15341 20 Replacement Pins for Vise Clamp, 1 2" long, pkg 10 Small Springloaded vise clamp for samples up to 12.

Not for use in electron microscopes

Cantilever Geometry: Special Cantilevers Number: 10

16326-20 - PELCO SEMClip™

ZEISS/LEO/Leica

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESP-V2

Designed to use in vacuum deposition systems for applications such as carbon evaporation

Technical Notes T (205KB PDF)

For JEOL SEMs there is a 25mm diameter cylinder mount available and for Hitachi SEMs the Low Profile SEMClip™ is available in 15 and 25mm diameter cylinder mounts

fine tips and superior finish 3C 115mm NM-SS 0

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RFESPA-40

18mm 5073 PELCO® ESD Safe Ergo Tweezers

Allen Wrenches

Exchange/Return Notes