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Description

HS-Series AFM Calibration StandardsDESCRIPTION Step heights of 20, 100 or 500nm. The HS series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z axis calibration the standards also offer X and Y axis calibration for bigger scanners in the 40 100um range. The structure symmetry enables calibration without the need to rotate and re align the sample in between x and Y axis calibration. The HS series feature silicon dioxide

A pack of 10 High quality etched silicon probes for soft TappingMode™ and other non-contact modes

Transmission 69%

PDMS Gel Sample

please go to the PELCO® Grids page

This paste is ideally suited for mounting specimens on hot stages for SEM

The latest addition to the cost effective FASTSCAN probe series is the FASTSCAN-D

Tip Geometry: High Aspect Ratio Tip Height: 10 - 15 Front Angle: 1

please see model SSRM-DIA

5 Tip Set Back( RNG): 8 - 15

Scanning Thermal Microscopy probes are specially designed contact mode probes that incorporate a thin metal film near the apex of the probe

Mo and Cu/Pd

50 grids/vial for Au